{"id":2773,"date":"2025-11-25T11:22:03","date_gmt":"2025-11-25T10:22:03","guid":{"rendered":"https:\/\/microrelleus.com\/?page_id=2773"},"modified":"2025-11-25T11:34:16","modified_gmt":"2025-11-25T10:34:16","slug":"ieee-i-spie","status":"publish","type":"page","link":"https:\/\/microrelleus.com\/ca\/recerca-desenvolupament-laser\/ieee-i-spie\/","title":{"rendered":"IEEE i SPIE"},"content":{"rendered":"
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IEEE i SPIE<\/h1><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div>
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Microrelleus va contribuir a projectes publicats per IEEE i SPIE, aplicant la seva experi\u00e8ncia en l\u00e0ser de femtosegon per engravir una xarxa de difracci\u00f3 reflectant en alumini, dissenyada per operar al voltant de ~3,3 THz en instrumentaci\u00f3 per a l\u2019espai profund. El nostre proc\u00e9s l\u00e0ser de 5 eixos va oferir una qualitat superficial excepcional i una efici\u00e8ncia de difracci\u00f3 superior al 85%, afavorint la polaritzaci\u00f3 TM per a un rendiment \u00f2ptic optimitzat.<\/p>

Tota la informaci\u00f3 en els seg\u00fcents enlla\u00e7os:<\/strong><\/p>

Reflective diffraction grating operating around 3,3 THz for space applications<\/a><\/p>

Experimental Analysis of the Spectral Reflectivity of Metallic Blazed Diffraction Gratings in the THz Range for Space Instrumentation | IEEE Journals & Magazine | IEEE Xplore<\/a><\/p>

< Tornar a R+D<\/a><\/span><\/p><\/div><\/div><\/div><\/div><\/div>

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